Sub-ångström transmission microscopy: A fourier transform algorithm for microdiffraction plane intensity information
- 30 November 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 31 (3) , 303-307
- https://doi.org/10.1016/0304-3991(89)90052-1
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The phase problem, microdiffraction and wavelength-limited resolution — a discussionUltramicroscopy, 1989
- Image reconstruction using electron microdiffraction patterns from overlapping regionsUltramicroscopy, 1986
- Reconstruction from in-line electron holograms by digital processingUltramicroscopy, 1986
- Electron MicrodiffractionPublished by Elsevier ,1978
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen ObjektenActa Crystallographica Section A, 1969
- Microscopy by Reconstructed Wave Fronts: IIProceedings of the Physical Society. Section B, 1951
- Microscopy by reconstructed wave-frontsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949
- A New Microscopic PrincipleNature, 1948