Computer controlled drifting of Si(Li) detectors
- 1 February 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (1) , 185-189
- https://doi.org/10.1109/23.34431
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Fast Diffusion in SemiconductorsAnnual Review of Materials Science, 1988
- The theory of compensation in lithium drifted semiconductor detectorsNuclear Instruments and Methods, 1969
- Diffusion of Li in Si at Highand the Isotope EffectPhysical Review B, 1960