Direct Measurement of Very Short Minority-Carrier Diffusion Lengths in Semiconductors
- 1 July 1971
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 42 (8) , 3249-3251
- https://doi.org/10.1063/1.1660716
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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