General Equation of the Decline in the Electric Strength for Combined Thermal and Electrical Stresses
- 1 February 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. EI-19 (1) , 45-52
- https://doi.org/10.1109/tei.1984.298732
Abstract
In this paper the equation for the decrease in the electric strength with time for combined thermal and electrical stresses is obtained, using the following assumptions: (a) the theory of total aging treated as a cumulative quantity, (b) the electric strength is a basic property for aging evaluation of an insulation, and (c) the life model, already proposed by the author for combined stresses is valid. The model is based on the inverse-power law for electrical aging, the Arrhenius relationship for thermal aging, and a linear dependence of the voltage endurance coefficient on thermal stress. The equation thus obtained represents a synthesis of all the main relationships used in electrical, thermal, and combined-stress endurance, and, in addition, includes a new model, that of the electric strength variation due to thermal stress. The comparison with the experimental curves shows a good agreement with the theory for both thermal and electrical stresses.Keywords
This publication has 8 references indexed in Scilit:
- New Voltage-Endurance Curves for Combined Thermal and Electrical Aging of Coil InsulationIEEE Transactions on Electrical Insulation, 1983
- A General Approach to the Endurance of Electrical Insulation under Temperature and VoltageIEEE Transactions on Electrical Insulation, 1981
- Application of the Equalized Ageing Process Method on Thermal Endurance Testing of Polyhydantoin FilmIEEE Transactions on Electrical Insulation, 1977
- A New Research into the Voltage Endurance of Solid DielectricsIEEE Transactions on Electrical Insulation, 1975
- A New Approach to the Voltage-Endurance Test on Electrical InsulationIEEE Transactions on Electrical Insulation, 1973
- Application of Cumulative Degradation Model to Acceleration Life TestIEEE Transactions on Reliability, 1968
- Application of the Eyring Model to Capacitor Aging DataIEEE Transactions on Component Parts, 1965
- Thermal Endurance of Rigid Electrical InsulationIEEE Transactions on Electrical Insulation, 1965