Surface-state band structure of the Si(100)2×1 surface studied with polarization-dependent angle-resolved photoemission on single-domain surfaces
- 15 July 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 42 (2) , 1305-1315
- https://doi.org/10.1103/physrevb.42.1305
Abstract
The electronic structure of the Si(100)2×1 surface has been studied with polarization-dependent angle-resolved photoemission. By using vicinal Si(100) samples, single-domain 2×1 surfaces were obtained, and the surface-band dispersions were measured unambiguously along the symmetry axes Γ¯-J¯’ and Γ¯-J¯ in the surface Brillouin zone (SBZ). The obtained dispersions are compared to dispersions from earlier studies of two-domain surfaces, as well as to theoretical band-structure calculations. In addition to the well-known surface state attributed to the dangling bonds, five more surface-related structures were observed on the single-domain surface. One of these is the controversial surface state previously observed on two-domain surfaces at J¯’ in the [010] direction at ∼0.9 eV below the Fermi level (), which is not accounted for in any calculated surface band structure for the Si(100)2×1 surface. Contrary to a previous report, it is also observed on the single-domain surface at several points in the SBZ.
Keywords
This publication has 51 references indexed in Scilit:
- Si(100) surfaces: Atomic and electronic structuresJournal of Vacuum Science and Technology, 1979
- Photoemission studies of intrinsic surface states on Si(100)Journal of Vacuum Science and Technology, 1979
- Atomic and Electronic Structures of Reconstructed Si(100) SurfacesPhysical Review Letters, 1979
- An electron diffraction study of the structure of silicon (100)Surface Science, 1978
- Three independent LEED studies of clean Si (100) surfacesJournal of Physics C: Solid State Physics, 1977
- The Si (100) surface. III. Surface reconstructionPhysical Review B, 1976
- Si(100) Surface Reconstruction: Spectroscopic Selection of a Structural ModelPhysical Review Letters, 1975
- Structural studies of the adsorption of Cs and O2 on Si(100)Surface Science, 1974
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962
- Structure and Adsorption Characteristics of Clean Surfaces of Germanium and SiliconThe Journal of Chemical Physics, 1959