SIERRA: a 3-D device simulator for reliability modeling
- 1 May 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 8 (5) , 516-527
- https://doi.org/10.1109/43.24880
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- SIMPL-2: (SIMulated Profiles from the Layout-Version 2)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Gate-voltage-dependent effective channel length and series resistance of LDD MOSFET'sIEEE Transactions on Electron Devices, 1987
- Semiconductor device modelling from the numerical point of viewInternational Journal for Numerical Methods in Engineering, 1987
- Latchup in CMOS TechnologyPublished by Springer Nature ,1986
- Semiconductor device simulation at NTTIEEE Transactions on Electron Devices, 1985
- Analysis of an anomalous subthreshold current in a fully recessed oxide MOSFET using a three-dimensional device simulatorIEEE Transactions on Electron Devices, 1985
- Conjugate gradient-like algorithms for solving nonsymmetric linear systemsMathematics of Computation, 1985
- On the simplification of generalized conjugate-gradient methods for nonsymmetrizable linear systemsLinear Algebra and its Applications, 1983
- Solution of Sparse Indefinite Systems of Linear EquationsSIAM Journal on Numerical Analysis, 1975
- Large-signal analysis of a silicon Read diode oscillatorIEEE Transactions on Electron Devices, 1969