Angular resolved x-ray photoemission study of defects induced by ion bombardment on the TiO2 surface

This publication has 26 references indexed in Scilit:

• Estimation of Low-Energy Ion Bombardment Damage on GaAs(001) Surface by X-Ray Photoelectron Diffraction
  Japanese Journal of Applied Physics, 1986
• X-Ray Photoelectron Diffraction (XPED) Studies on Metal Oxide Surfaces. (I) Analysis of the XPED Patterns from TiO2(001) and α-Al2O3(0001) by the Single Scattering Calculation
  Bulletin of the Chemical Society of Japan, 1985
• XPS investigation of strong metal-support interactions on Group IIIa?Va oxides
  Journal of Catalysis, 1982
• Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
  Surface and Interface Analysis, 1981
• Photoelectron diffraction effects in XPS angular distributions from GaAs(110) and Ge(110) single crystals
  Journal of Electron Spectroscopy and Related Phenomena, 1981
• On the reliability of intensity measurements for surface structure analysis by LEED
  Journal of Physics C: Solid State Physics, 1980
• Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
  Japanese Journal of Applied Physics, 1980
• Azimuthal Anisotropy in Core-Level X-Ray Photoemission fromc(2×2)Oxygen on Cu(001): Experiment and Single-Scattering Theory
  Physical Review Letters, 1978
• Observation of Two-Dimensional Phases Associated with Defect States on the Surface of TiO2
  Physical Review Letters, 1976
• Electrochemical Photolysis of Water at a Semiconductor Electrode
  Nature, 1972