Observations of Dislocations in White Tin Using High-Resolution Electron Microscopy
- 1 April 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (4A) , L496
- https://doi.org/10.1143/jjap.27.l496
Abstract
End-on dislocations in white tin crystals have been examined using high-resolution electron microscopy. The experimental lattice images indicated the dissociation of a perfect dislocation lying in the (100) plane. The imperfect dislocation formed by the dissociation had a Burgers vector ½[010].Keywords
This publication has 23 references indexed in Scilit:
- Observation and interpretation of the atomic structure of a [Sgrave] = 19/[110] (331) tilt boundary in Au thin filmsPhilosophical Magazine A, 1986
- High resolution electron microscopic investigations of dislocations in deformed GaAs single crystals doped with TePhysica Status Solidi (a), 1984
- Motions of Individual Dislocations in White Tin Single Crystals Deformed in TensionJapanese Journal of Applied Physics, 1983
- Lattice Image Observation of Extended Dislocations in CdS by High Resolution Electron MicroscopyJapanese Journal of Applied Physics, 1982
- Characterization of [001] tilt boundaries in gold by high-resolution transmission electron microscopyPhilosophical Magazine A, 1981
- HVEM Structure Images of Extended 60° - and Screw Dislocations in SiliconJapanese Journal of Applied Physics, 1980
- Motion of extended dislocations in silicon crystals observed by HVEMPhysica Status Solidi (a), 1979
- On the Burgers Vectors in β-Sn Single CrystalsPhysica Status Solidi (a), 1975
- Elastic and Plastic Anisotropy of White TinCanadian Journal of Physics, 1972
- Züchtung, Präparation und Röntgentopographie nahezu idealer Sn-KristallePhysica Status Solidi (a), 1970