New results with semiconductor drift chambers for X-ray spectroscopy
- 1 August 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (4) , 1048-1053
- https://doi.org/10.1109/23.322856
Abstract
Proceeding of the IEEE Nuclear Science Symposium, San Francisco, CA, USA, October 30 November 6, 199Keywords
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