Carrier relaxation time from infrared reflection spectra in semiconductors
- 15 July 1971
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 9 (14) , 1267-1270
- https://doi.org/10.1016/0038-1098(71)90026-3
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Use of plasma edge reflection measurements in the study of semiconductorsJournal of Physics C: Solid State Physics, 1968
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- Measurement of the Conductivity Effective Mass in Semiconductors Using Infrared ReflectionPhysical Review B, 1964
- Determination of Optical Constants and Carrier Effective Mass of SemiconductorsPhysical Review B, 1957