Suppression and origin of soft ESD failures in a submicron CMOS process

This publication has 2 references indexed in Scilit:

• ESD failure modes: characteristics mechanisms, and process influences
  IEEE Transactions on Electron Devices, 1992
• Characterization and modeling of second breakdown in NMOST's for the extraction of ESD-related process and design parameters
  IEEE Transactions on Electron Devices, 1991