Total-reflection X-ray fluorescence imaging
- 1 October 1999
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 54 (10) , 1497-1503
- https://doi.org/10.1016/s0584-8547(99)00071-3
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- A grazing-incidence reflectometer for BL-39XU at SPring-8Journal of Synchrotron Radiation, 1998
- An X‐ray CameraSynchrotron Radiation News, 1996
- X-ray imaging of polycrystalline materialsa)Review of Scientific Instruments, 1995
- Laboratory grazing-emission x-ray fluorescence spectrometerReview of Scientific Instruments, 1995
- Fluorescent-x-ray-interference effect in layered materialsPhysical Review B, 1993
- Synchrotron X-ray muprobe and its application to human hair analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993
- X-ray detection characteristics of microchannel plates in the energy range from 1.8 to 8 keVReview of Scientific Instruments, 1989
- Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge ShiftsJapanese Journal of Applied Physics, 1988
- X-Ray Evanescent-Wave Absorption and EmissionPhysical Review Letters, 1983