Elimination of the α1α2 Doublet in X-Ray Patterns
- 1 August 1959
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 30 (8) , 725-727
- https://doi.org/10.1063/1.1716734
Abstract
The characteristic K‐radiation employed in x‐ray diffraction consists of the bichromatic wavelengths λ(α1) and λ(α2). In practice the observed diffraction pattern is the superposition of the patterns of the two components. In many cases it is necessary to determine the diffraction pattern for a single wavelength. An analytical method for determining such a pattern from the observed superimposed pattern has been developed. The method can be applied to eliminate the doublet from the entire pattern or any particular section. The method can be used to correct diffraction patterns used in their entirety in radial distribution analysis, and is also very useful in line profile work and lattice parameter determinations.Keywords
This publication has 5 references indexed in Scilit:
- Method of Correction for the α1 α2 Doublet in the X-Ray Diffraction LinesReview of Scientific Instruments, 1955
- A Correction to the Diameter Measurement of Diffuse X-Ray Diffraction RingsNature, 1949
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948
- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938