Liquid crystal imaging for temperature measurement of electronic devices

Publisher Website

9 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/stherm.1991.152907

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Thermo-reliability relationships of GaAs ICs
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
A DC technique for determining GaAs MESFET thermal resistance
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1989