On depth resolution by 3He profiling using the 3He(d, α)1H reaction

This publication has 9 references indexed in Scilit:

• Small-angle multiple scattering of ions in the screened Coulomb region: I. Angular distributions
  Published by Elsevier ,2002
• The use of 12C(d, p)13C and 16O(d, p)17O reactions to profile carbon and oxygen in solids
  Nuclear Instruments and Methods, 1978
• Analysis of straggling measurements by the backscattering technique
  Nuclear Instruments and Methods, 1978
• Large depth profile measurements of D, 3He, and 6Li by deuteron induced nuclear reactions
  Nuclear Instruments and Methods, 1977
• Small-angle multiple scattering of ions in the screened Coulomb region: 2. Lateral spread
  Nuclear Instruments and Methods, 1975
• The optimization of a rutherford backscattering geometry for enhanced depth resolution
  Nuclear Instruments and Methods, 1975
• Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92, E(4He) = 400–4000 keV
  Atomic Data and Nuclear Data Tables, 1974
• Depth profiles of aluminum and sodium near surfaces: Nuclear resonance method
  Thin Solid Films, 1973
• Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layers
  Nuclear Instruments and Methods, 1973