Two-dimensional mapping of the microwave potential on MMICs using electrooptic sampling
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 41 (6) , 1149-1158
- https://doi.org/10.1109/22.238540
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Voltage calibration of the direct electrooptic sampling techniqueIEEE Transactions on Microwave Theory and Techniques, 1992
- Electro-optic imaging of the internal fields in a GaAs photoconductive switchJournal of Applied Physics, 1990
- Chapter 7 Photoemissive ProbingPublished by Elsevier ,1990
- Chapter 6 Electron-Beam ProbingPublished by Elsevier ,1990
- Investigation of Internal Signal Propagation of an Integrated Circuit with High Temporal ResolutionSpringer Proceedings in Physics, 1990
- Picosecond optical sampling of GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1988
- Measurement Techniques for Planar High-Frequency Circuits (Short Paper)IEEE Transactions on Microwave Theory and Techniques, 1986
- Electric Probe Measurements on Dielectric Image Lines in the Frequency Range of 26-90 GHzIEEE Transactions on Microwave Theory and Techniques, 1978
- Optical Constants of Clean Titanium and Tungsten Surfaces as Functions of TemperatureJournal of the Optical Society of America, 1972
- The reflection of electromagnetic waves from a rough surfaceProceedings of the IEE - Part IV: Institution Monographs, 1954