Determination of crystallographic polarity of CdTe crystals with Auger electron spectroscopy
- 1 February 1987
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 61 (3) , 924-927
- https://doi.org/10.1063/1.338143
Abstract
The crystallographic polarity of CdTe crystals has been studied with Auger electron spectroscopy. The polarity of various surfaces could be determined by normalizing the low-energy Te (NOO) peak with the high-energy Te (MNN) peak. Upon comparing the normalized ratios from both {111} surfaces, the ratio from (111) Te surfaces was found to be about 1.3 times that from (111) Cd surfaces. The identified polarity was consistent with recent results of anomalous absorption of x rays, the convergent beam method of transmission electron microscopy, and chemical etching. Air-cleaved {110} surfaces of CdTe crystals and surfaces of pure Te crystals were studied for comparison as well.This publication has 24 references indexed in Scilit:
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