Electron diffraction in porous silicon
- 31 December 1984
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 13 (4) , 379-385
- https://doi.org/10.1016/0304-3991(84)90004-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Electron diffraction in crystalline specimens containing a high density of lattice defects. I. Development of a statistical theoryPhysica Status Solidi (a), 1977
- Calculations and observations of the weak-beam contrast of small lattice defectsJournal of Microscopy, 1973
- Application of high voltage electron microscopy to low‐temperature radiation damage studies in metalsJournal of Microscopy, 1973