A comparison between quadrupole and magnetic mass spectrometers for use in SIM
- 30 November 1972
- Vol. 22 (11) , 609-612
- https://doi.org/10.1016/0042-207x(72)90036-x
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Some basic considerations concerning the sensitivity of sputter ion mass spectrometersInternational Journal of Mass Spectrometry and Ion Physics, 1971
- Tandem Mass Spectrometer for Secondary Ion StudiesReview of Scientific Instruments, 1971
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967
- Sputtering Ion Source for SolidsJournal of Applied Physics, 1963