Microscopic Evidence of Plastic Deformation on Cleaved Germanium Surfaces
- 1 May 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (6) , 2472-2477
- https://doi.org/10.1063/1.1709931
Abstract
A study of cleaved germanium surfaces by transmission electron microscopy and gold transfer replicas provides direct and indirect evidence of plastic deformation introduced by the cleavage process at room temperature. The results are interpreted as showing that dislocations move by glide on {111}‐type planes parallel to the surface and at 70°32′ to the surface. Experiments are also reported using copper plating as a technique for decorating surface damage.This publication has 9 references indexed in Scilit:
- Contact barriers on cleaved germanium surfacesSolid-State Electronics, 1967
- Contact studies on semiconductor cleavage surfaces under liquidsSurface Science, 1966
- Decoration of Semiconductor Surfaces for Electron Microscopy by Displacement Deposition of GoldJournal of Applied Physics, 1966
- Transmission Electron Microscopy of Cleaved SiliconJournal of Applied Physics, 1963
- Decoration of Imperfections on Cleaved GermaniumJournal of Applied Physics, 1963
- Method of preparing Si and Ge specimens for examination by transmission electron microscopyBritish Journal of Applied Physics, 1962
- Cleavage Cracks and Dislocations in LiF CrystalsJournal of Applied Physics, 1958
- Precision Determination of Lattice Constants with a Geiger-Counter X-Ray DiffractometerPhysical Review B, 1955
- LXXXVII. Theory of dislocations in germaniumJournal of Computers in Education, 1954