Preparation of self-supporting anodic barrier films on aluminium for backscattering analysis
- 1 October 1982
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 4 (5) , 208-211
- https://doi.org/10.1002/sia.740040507
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Principles and applications of ion beam techniques for the analysis of solids and thin filmsThin Solid Films, 1973
- Microanalysis of Materials by Backscattering SpectrometryScience, 1972
- Channeling-Effect Analysis of Thin Films on Silicon: Aluminum OxideJournal of Applied Physics, 1971
- Preparation and Some Characteristics of Self-Supporting 300–2500 Å Oxide FilmsJournal of Vacuum Science and Technology, 1969