A comparison study of ESD protection for RFIC's: performance vs. parasitics
- 7 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 143-146
- https://doi.org/10.1109/mwsym.2000.860904
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A novel on-chip electrostatic discharge (ESD) protection with common discharge line for high-speed CMOS LSIsIEEE Transactions on Electron Devices, 1997