A novel on-chip electrostatic discharge (ESD) protection with common discharge line for high-speed CMOS LSIs
- 1 July 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 44 (7) , 1124-1130
- https://doi.org/10.1109/16.595940
Abstract
No abstract availableKeywords
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