Internal chip ESD phenomena beyond the protection circuit
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 35 (12) , 2133-2139
- https://doi.org/10.1109/16.8787
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Hot electron reliability and ESD latent damagePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- ESD protection: design and layout issues for VLSI circuitsIEEE Transactions on Industry Applications, 1989
- NMOS protection circuitryIEEE Transactions on Electron Devices, 1985
- ESD on CHMOS Devices - Equivalent Circuits, Physical Models and Failure Mechanisms8th Reliability Physics Symposium, 1985