Photoreflectance characterization of OMVPE GaAs on Si
- 1 January 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 93 (1-4) , 481-486
- https://doi.org/10.1016/0022-0248(88)90570-2
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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