Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM's
- 1 June 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 21 (6) , 310-312
- https://doi.org/10.1109/55.843160
Abstract
Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some important issues remain to be clarified in neutron-induced SE phenomena. This letter reports the geometric effect of multiple-bit SE's induced by neutrons. Multiple-bit SE's in 16 Mb DRAM's are investigated and their geometric effects on high reliability systems are discussed.This publication has 10 references indexed in Scilit:
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