C60, Buckminsterfullerene: its impact on biological ToF‐SIMS analysis
- 18 October 2006
- journal article
- review article
- Published by Wiley in Surface and Interface Analysis
- Vol. 38 (11) , 1393-1400
- https://doi.org/10.1002/sia.2461
Abstract
The desire to apply the analytical abilities of the time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) experiment to increasingly diverse samples, particularly those of a biological nature, has provided the impetus for development of new technologies to overcome some of the inherent difficulties associated with such studies. Of these, one of the most important is the widespread introduction of polyatomic ion beams to increase the secondary ion yields of the higher mass, more chemically characteristic species. The introduction of the C60 ion beam for routine analysis has made arguably the greatest impact, providing new possibilities for analysing molecular compounds present both on the surface and in some cases in the bulk of samples such as biological tissue sections and single cells. Copyright © 2006 John Wiley & Sons, Ltd.Keywords
This publication has 44 references indexed in Scilit:
- Is proton cationization promoted by polyatomic primary ion bombardment during time‐of‐flight secondary ion mass spectrometry analysis of frozen aqueous solutions?Rapid Communications in Mass Spectrometry, 2006
- TOF-SIMS Analysis Using C60. Effect of Impact Energy on Yield and DamageAnalytical Chemistry, 2006
- The Magic of Cluster SIMSAnalytical Chemistry, 2005
- Molecular Depth Profiling of Histamine in Ice Using a Buckminsterfullerene ProbeAnalytical Chemistry, 2004
- A Theoretical Investigation of the Yield-to-Damage Enhancement with Polyatomic Projectiles in Organic SIMSThe Journal of Physical Chemistry B, 2000
- Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid SurfacesAnalytical Chemistry, 1996
- Massive cluster ablation as preparation for organic secondary ion imagingRapid Communications in Mass Spectrometry, 1995
- Appearance and ionization energies of singly, doubly and triply charged C60 and its fragment ions produced by electron impact ionizationInternational Journal of Mass Spectrometry and Ion Processes, 1994
- Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compoundsAnalytical Chemistry, 1990
- Secondary-ion yields from surfaces bombarded with keV molecular and cluster ionsPhysical Review Letters, 1989