Microstructural investigations of FeN and FeAlN thin films for recording head applications
- 1 September 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 28 (5) , 2418-2420
- https://doi.org/10.1109/20.179511
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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