Crosstalk in coupled microstrip lines due to substrate permittivity and S/h ratios

1 January 1994

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 301-304
https://doi.org/10.1109/southc.1994.498120

Abstract

The Finite Element Method (FEM) is used to determine the magnitude of crosstalk due to substrate permittivities and S/h ratios in a pair of parallel coplanar microstrip lines. One trace is driven by an ideal current source (generator strip) and the other line is a passive (receptor) strip. At the operating frequency of 200 MHz, the dielectric of the substrates is assumed to be lossless and homogeneous. Computed results when compared with the results obtained from analytical formulation show a good agreement. Further, the study indicates that an increase in the substrate permittivity would increase the crosstalk.

Keywords

This publication has 6 references indexed in Scilit:

Introduction to Electromagnetic Compatibility
Published by Wiley ,2005
A simple SPICE model for coupled transmission lines
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Crosstalk computation in coupled transmission lines
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
Finite element method applied to modeling crosstalk problems on printed circuit boards
IEEE Transactions on Electromagnetic Compatibility, 1989
THE ANALYSIS OF COAXIALLY FED MICROSTRIP ANTENNAS WITH ELECTRICALLY THICK SUBSTRATES
Electromagnetics, 1989
Finite Element Method Applied to Skin-Effect Problems in Strip Transmission Lines
IEEE Transactions on Microwave Theory and Techniques, 1987