Simultaneous determination of the optical indices of an absorbant film and its metallic substrate by statistical analysis of spectroreflectometric data: Application to the oxide/titanium system
- 1 November 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 38 (3) , 261-270
- https://doi.org/10.1016/0040-6090(76)90005-5
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Optical properties of Ti, Zr, and Hf from 0.15 to 30 eVPhysical Review B, 1975
- Influence of an initial (contamination) film on the determination of film properties by ellipsometryJournal of the Optical Society of America, 1975
- Oxydation anodique du titane en solution sulfurique : nature, épaisseur et indice de réfraction des films formésJournal de Chimie Physique et de Physico-Chimie Biologique, 1975
- Optical constants of transition metals: Ti, V, Cr, Mn, Fe, Co, Ni, and PdPhysical Review B, 1974
- Optical constants of titaniumJournal of the Optical Society of America, 1974
- Optical constants of thin oxide films on titaniumCzechoslovak Journal of Physics, 1973
- Dielectric properties of electrolyte solutions. Lithium perchlorate solutions in tetrahydrofuran + benzene mixturesJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1973
- Ellipsometric Technique for Obtaining Substrate Optical ConstantsJournal of Applied Physics, 1970
- Évaluations optimales des inconnues d'un système statistique non linéaire. I. Principe et théorieJournal de Physique, 1969
- A Simplex Method for Function MinimizationThe Computer Journal, 1965