The characterization of semiconductor layer and interface quality with special reference to raman spectroscopy
- 31 December 1996
- journal article
- Published by Elsevier in Progress in Crystal Growth and Characterization of Materials
- Vol. 32 (4) , 185-224
- https://doi.org/10.1016/0960-8974(96)00003-4
Abstract
No abstract availableThis publication has 60 references indexed in Scilit:
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