SEM and XPS studies of titanium dioxide thin films grown by MOCVD
- 1 June 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 322 (1-2) , 63-67
- https://doi.org/10.1016/s0040-6090(97)00958-9
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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