LRM and LRRM Calibrations with Automatic Determination of Load Inductance
- 1 November 1990
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 18, 57-63
- https://doi.org/10.1109/arftg.1990.323996
Abstract
Two new techniques are presented in an effort to achieve greater accuracy and better repeatability in the on-wafer calibration of vector network analyzers. The first is a method of determining an inductance value for the match standard during the calibration process so that only its resistance, not its reactance, needs to be known. The second is a new type of calibration, LRRM (line-reflect-reflect-match), which is a variation of LRM with several possible advantages. Also, a simple series resistance-inductance model for a coplanar load is experimentally investigated to 40 GHz and found to provide a good description of the load behavior.Keywords
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