A wafer-scale FFT processor featuring a repeatable building block

Publisher Website

7 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/wafer.1989.47560

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

A wafer-scale 170000-gate FFT processor with built-in test circuits
IEEE Journal of Solid-State Circuits, 1988
A wafer-scale digital integrator using restructurable VSLI
IEEE Transactions on Electron Devices, 1985
Wafer-scale integration-a fault-tolerant procedure
IEEE Journal of Solid-State Circuits, 1978