Crystallization of an amorphous lead zirconate titanate thin film with a dense-plasma-focus device

Abstract
The pulsed ion beam of highly energetic argon ions that is generated during the focus phase of the dense-plasma-focus (DPF) device is used to crystallize the as-grown rf-sputtered amorphous thin film of lead zirconate titanate (PZT). Many samples of PZT thin films of different thicknesses are exposed to the DPF device. The 0.9-μm-thick PZT thin film is crystallized to the desired rhombohedral phase. The scanning electron microscopy photograph of this film indicates a reasonably good surface quality.