On Fault Identification in Diagnosable Systems
- 1 June 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-30 (6) , 414-422
- https://doi.org/10.1109/tc.1981.1675807
Abstract
This paper begins by giving a characterization of t1/ t1—diagnosable systems. Then a class of t0-diagnosable systems, denoted by d(n,t0,X), is considered. It is shown for any member of this class that: 1) necessary and sufficient conditions for t1/t1—diagnosability are greatly simplified, 2) optimal diagnosis algorithms of time complexity 0(nt0) exist, and most importantly, 3) given the test results, any set F of faults with |F| ≤ t1 can be identified to within a set F' with F ⊆ F' and |F'| ≤ min {t1, |F| + 1}.Keywords
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