Automatic solder joint inspection
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 10 (1) , 31-43
- https://doi.org/10.1109/34.3865
Abstract
The task of automating the visual inspection of pin-in-hole solder joints is addressed. Two approaches are explored: statistical pattern recognition and expert systems. An objective dimensionality-reduction method is used to enhance the performance of traditional statistical pattern recognition approaches by decorrelating feature data, generating feature weights, and reducing run-time computations. The expert system uses features in a manner more analogous to the visual clues that a human inspector would rely on for classification. Rules using these cues are developed, and a voting scheme is implemented to accumulate classification evidence incrementally. Both methods compared favorably with human inspector performance.Keywords
This publication has 11 references indexed in Scilit:
- Machine-vision techniques for inspection of printed wiring boards and thick-film circuitsJournal of the Optical Society of America A, 1986
- “;Expert” vision systems: Some issuesComputer Vision, Graphics, and Image Processing, 1986
- Automatic visual solder joint inspectionIEEE Journal on Robotics and Automation, 1985
- Model-based inspection system for component boardsPattern Recognition, 1984
- Extraction of lines and regions from grey tone line drawing imagesPattern Recognition, 1984
- A system for the automatic visual inspection of bare-printed circuit boardsIEEE Transactions on Systems, Man, and Cybernetics, 1984
- Automatic Visual Inspection Of Solder Joints On Printed Circuit BoardsPublished by SPIE-Intl Soc Optical Eng ,1982
- Automated Visual Inspection: A SurveyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1982
- A Method for Automating the Visual Inspection of Printed Wiring BoardsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1980
- A Recursive Partitioning Decision Rule for Nonparametric ClassificationIEEE Transactions on Computers, 1977