XPS study of BN thin films deposited by CVD on SiC plane substrates
- 1 July 1990
- journal article
- ceramics and-glass
- Published by Wiley in Surface and Interface Analysis
- Vol. 16 (1-12) , 440-445
- https://doi.org/10.1002/sia.740160191
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- A Ceramic-Ceramic Composite with Low Dielectric Constant and Nonbrittle FailureAdvanced Ceramic Materials, 1988
- Properties of boron nitride coating films prepared by the ion beam and vapor deposition method (IVD)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Characterization of β-SiC surfaces and the Au/SiC interfaceJournal of Vacuum Science & Technology A, 1986
- A study of chemical bonding in suboxides of silicon using Auger electron spectroscopyJournal of Vacuum Science & Technology A, 1986
- Interfacial Characterizations of Fiber-Reinforced Sic Composites Exhibiting Brittle and Toughened Fracture BehaviorMRS Proceedings, 1986
- Conjugated one and two dimensional polymersProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1979
- Photoelectron and Auger SpectroscopyPublished by Springer Nature ,1975
- Cubic Form of Boron NitrideThe Journal of Chemical Physics, 1957
- Studies in Graphite and Related Compounds I: Electronic Band Structure in GraphiteProceedings of the Physical Society. Section A, 1952
- An X-ray study of boron nitrideActa Crystallographica, 1952