A double-detector method for precise identification of the depth location of light atoms in ERD analysis
- 15 October 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 51 (4) , 446-451
- https://doi.org/10.1016/0168-583x(90)90566-d
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Resonant helical divertor experiments in ohmic and auxiliary heated JIPP T-IIU plasmasJournal of Nuclear Materials, 1989
- Enrichment depth profiles in polymer blends measured by forward recoil spectrometryApplied Physics Letters, 1989
- The analysis of elastic recoil detection dataNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Hydrogen depth profiling using the 6.46 MeV 1H(19F, αγ)16O resonance by detection of alpha particlesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- A computer-controlled particle collection and surface analysis system for tokamak scrape-of-layer analysisNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- Depth resolution and recoil cross section for analyzing hydrogen in solids using elastic recoil detection with 4He beamNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Depth profiling of hydrogen by detection of recoiled protonsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Technique for profiling 1H with 2.5-MeV Van de Graaff acceleratorsApplied Physics Letters, 1979
- A review on depth profiling of hydrogen and helium isotopes within the near-surface region of solids by use of ion beamsJournal of Nuclear Materials, 1978
- Profiling hydrogen in materials using ion beamsNuclear Instruments and Methods, 1978