Accuracy of thick-target micro-PIXE analysis
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 50 (1-4) , 189-196
- https://doi.org/10.1016/0168-583x(90)90354-w
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Fitted empirical reference cross sections for K-shell ionization by protonsAtomic Data and Nuclear Data Tables, 1989
- Stopping powers of Al and Cu for protons from 3 TO 9 MeVNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Limits of detection and quantitation in PIXE analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Effects of random surface roughness in pixe analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Relativistic cross sections for atomic K- and L-shell ionization by protons, calculated from a Dirac-Hartree-Slater modelAtomic Data and Nuclear Data Tables, 1985
- PIXE analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Uncertainties in thick-target PIXE analysisNuclear Instruments and Methods in Physics Research, 1983
- Atomic radiative and radiationless yields for K and L shellsJournal of Physical and Chemical Reference Data, 1979
- Exchange corrections ofx-ray emission ratesPhysical Review A, 1974
- LX. On the decrease of velocity of swiftly moving electrified particles in passing through matterJournal of Computers in Education, 1915