Effects of random surface roughness in pixe analysis of thick targets
- 1 October 1985
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 12 (3) , 402-412
- https://doi.org/10.1016/0168-583x(85)90040-0
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- PIXE analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Particle induced X-ray emission (PIXE) analyses on metal samples with structured surfacesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Specimen surface effects in thick-target PIXE analysisNuclear Instruments and Methods in Physics Research, 1983
- Surface topology using rutherford backscatteringNuclear Instruments and Methods, 1980
- Proton-induced X-ray emission in the trace analysis of human tooth enamel and dentineThe International Journal of Applied Radiation and Isotopes, 1976