How epitaxial are Pd2SiSi interfaces?
- 1 June 1983
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 104 (1-2) , 17-29
- https://doi.org/10.1016/0040-6090(83)90545-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Surface roughness induced scattering and band tailingSurface Science, 1982
- Chemical bonding and electronic structure ofSiPhysical Review B, 1980
- Metallurgical properties and electrical characteristics of palladium silicide-silicon contactsSolid-State Electronics, 1971
- Some Notes on the Palladium-Silicon System.Acta Chemica Scandinavica, 1966