Carrier-Concentration-Dependent Phase Transition in SnTe
- 20 September 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 37 (12) , 772-774
- https://doi.org/10.1103/physrevlett.37.772
Abstract
The transition temperature of the displacive phase transition in SnTe as a function of the carrier concentration is determined by measurements of the resistance anomaly. The transition temperature decreases gradually with increasing and vanishes at . The results are explained by the electron-TO-phonon interaction model with an optical-deformation-potential constant of 10 eV.
Keywords
This publication has 9 references indexed in Scilit:
- Displacive Phase Transition in Narrow-Gap SemiconductorsJournal of the Physics Society Japan, 1976
- Resistance anomaly due to displacive phase transition in SnTeSolid State Communications, 1975
- Dielectric constant and soft mode of Pb1-xSnxTe by magnetoplasma reflectionSolid State Communications, 1975
- Phase Transition in SnTe with Low Carrier ConcentrationJournal of the Physics Society Japan, 1975
- Raman observation of the ferroelectric phase transition in SnTePhysical Review B, 1974
- Fermi-Surface Studies in SnTePhysical Review B, 1972
- Weak-Field Magnetoresistance and the Valence-Band Structure of SnTePhysical Review B, 1972
- Pseudo‐Jahn‐Teller Effect and Second Order Phase Transitions in CrystalsPhysica Status Solidi (b), 1967
- Diatomic FerroelectricsPhysical Review Letters, 1966