Calculation of IR reflection spectra of inhomogeneously doped semiconductors
- 31 January 1978
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 18 (1) , 23-33
- https://doi.org/10.1016/0020-0891(78)90006-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Non-Destructive Measurement of Surface Concentrations and Junction Depths of Diffused Semiconductor LayersJapanese Journal of Applied Physics, 1968
- The Reflection Coefficient of Optically Inhomogeneous SolidsPhysica Status Solidi (b), 1967
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- L'admittance optique des couches homogènes et hétérogènesJournal de Physique et le Radium, 1950