Piezo-optical response of Ge in the visible–uv range
- 15 May 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (20) , 11721-11735
- https://doi.org/10.1103/physrevb.45.11721
Abstract
Using rotating-analyzer ellipsometry we have measured the three complex components (ω), (ω), and (ω) of the linear piezo-optical tensor (ω) of Ge in the 1.6–5.6 eV photon energy range. This was accomplished by applying static uniaxial stress to Ge crystals along the [111] and [001] crystallographic directions, and monitoring the stress-induced changes in the dielectric function ε(ω) at room temperature. The real and imaginary parts of each component were directly obtained. They show, in general, good Kramers-Kronig consistency. A comparison with pseudopotential calculations of (ω), (ω), and (ω) for strained Ge is also given. In addition, deformation-potential constants (,,,) and spin-exchange parameters (,) were determined for the -+ transitions; they show good agreement with prior work.
Keywords
This publication has 44 references indexed in Scilit:
- Optical control of growth of AlxGa1−xAs by organometallic molecular beam epitaxyApplied Physics Letters, 1990
- Piezobirefringence above the fundamental edge in SiPhysical Review B, 1978
- Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimetersReview of Scientific Instruments, 1978
- Modulation spectroscopy under uniaxial stressSurface Science, 1973
- Identification ofTransitions in theRegion of Germanium by Piezoreflectance MeasurementsPhysical Review B, 1972
- Effects of uniaxial stress on the Eo1-peak of siliconSolid State Communications, 1971
- Strain Effects on Optical Critical-Point Structure in Diamond-Type CrystalsPhysical Review B, 1969
- Piezo-Electroreflectance in Ge, GaAs, and SiPhysical Review B, 1968
- Polarization Dependence of the Piezoreflectance in Si and GePhysical Review Letters, 1965
- Dependence of the Optical Constants of Silicon on Uniaxial StressPhysical Review Letters, 1965