Survey of dopants in silicon for 2–2.7 and 3–5 μm infrared detector application
- 31 January 1977
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 17 (1) , 71-82
- https://doi.org/10.1016/0020-0891(77)90098-7
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Extrinsic silicon detectors for 3–5 and 8–14 μmInfrared Physics, 1976
- Study of Beryllium and Beryllium-Lithium Complexes in Single-Crystal SiliconPhysical Review B, 1972
- Beryllium as an acceptor in siliconSolid State Communications, 1968
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- Properties of Silicon Doped with Iron or CopperPhysical Review B, 1957
- Double-Acceptor Behavior of Zinc in SiliconPhysical Review B, 1957