Application of asymmetric reflections to the X-ray study of structural deformation of surfaces
- 1 April 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 78 (4) , 327-334
- https://doi.org/10.1016/0040-6090(81)90035-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- X-Ray characterization of the anisotropy properties of thin filmsLettere al Nuovo Cimento (1971-1985), 1979
- Evidence for the Fankuchen effect in neutron diffraction by curved crystalsActa Crystallographica Section A, 1977
- Stresses in Epitaxially Grown Single-Crystal Films: YIG on YAGJournal of Applied Physics, 1970