X-Ray characterization of the anisotropy properties of thin films
- 1 January 1979
- journal article
- Published by Springer Nature in Lettere al Nuovo Cimento (1971-1985)
- Vol. 24 (2) , 33-38
- https://doi.org/10.1007/bf02725741
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Modified Diffractometer for X-ray Stress MeasurementsAdvances in X-ray Analysis, 1976
- The Effects of X-Ray Optics on Residual Stress Measurements in SteelAdvances in X-ray Analysis, 1973