A pulse generation circuit for improved measurement of current transients in ferroelectric thin films
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 41 (5) , 716-719
- https://doi.org/10.1109/19.177350
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- The effect of ionizing radiation on sol-gel ferroelectric PZT capacitorsIEEE Transactions on Nuclear Science, 1990
- Processing and parameters of sol-gel PZT thin-films for GaAs memory applicationsFerroelectrics, 1990
- Integrated sol-gel PZT thin-films on Pt, Si, and GaAs for non-volatile memory applicationsFerroelectrics, 1990
- Ferroelectric MemoriesScience, 1989