Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate
- 15 March 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 53 (12) , 8065-8070
- https://doi.org/10.1103/physrevb.53.8065
Abstract
The interaction force gradient between a micron-size polystyrene sphere and an atomically flat highly oriented pyrolytic graphite substrate has been analyzed as a function of surface-to-surface separation distance using an oscillating cantilever technique. The interaction force gradient was found to have two contributions. For ≥30 nm, an electrostatic force due to charges trapped on the polystyrene sphere dominates. For ≤30 nm, a van der Waals interaction, characteristic of a sphere near a flat plane, is observed. Fits to the data are in good agreement with theoretical expectations and allow estimates of the surface charge density triboelectrically produced on the sphere’s surface. © 1996 The American Physical Society.
Keywords
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